Radiation hardness of plastic scintillating fiber against fast neutron and γ-ray irradiationMURAKAMI, A; YOSHINAKA, H; GOTO, M et al.IEEE transactions on nuclear science. 1993, Vol 40, Num 4, pp 495-499, issn 0018-9499Conference Paper

Development of radiation hard semiconductor sensors for charged particle tracking at very high luminositiesBETANCOURT, Christopher; FADEYEV, Vitaliy; SADROZINSKI, Hartmut F.-W et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7817, issn 0277-786X, isbn 978-0-8194-8313-3, 78170J.1-78170J.10Conference Paper

A new accelerator for electron beam curingSCHWAB, Ulrich.Vacuum. 2001, Vol 62, Num 2-3, pp 217-224, issn 0042-207XConference Paper

Preparation methods and characteristics of fluorinated polymers for mold replicationTSUNOZAKI, Kentaro; KAWAGUCHI, Yasuhide.Microelectronic engineering. 2009, Vol 86, Num 4-6, pp 694-696, issn 0167-9317, 3 p.Conference Paper

Nanophotonics and macrophotonics for space environments II (11-12 August 2008, San Diego, California, USA)Taylor, Edward W; Cardimona, David A.Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7095, issn 0277-786X, isbn 978-0-8194-7315-8 0-8194-7315-4, 1 v. (various pagings), isbn 978-0-8194-7315-8 0-8194-7315-4Conference Proceedings

Moyens de tests radiatifs pour la physique des hautes énergies = Radiation facilities for high energy physicsHABRARD, M.-C.Onde électrique. 1995, Vol 75, Num 3, pp 49-52, issn 0030-2430Article

Effect of mobility of small clusters on radiation strengthening of copperSZENES, G; HAVANCSAK, K.Journal of nuclear materials. 1994, Vol 212-15, Num A, pp 216-220, issn 0022-3115Conference Paper

Noise-tolerant ultrasonic distance sensor based on a multiple driving approachGRIMALDI, U; PARVIS, M.Measurement. 1995, Vol 15, Num 1, pp 33-41, issn 0263-2241Article

Changes in the Temperature of a Dental Light-Cured Composite Resin by Different Light-Curing UnitsRASTELLI, A. N. S; JACOMASSI, D. P; BAGNATO, V. S et al.Laser physics. 2008, Vol 18, Num 8, pp 1003-1007, issn 1054-660X, 5 p.Article

Moyens de simulation des effets transitoires des rayonnements ionisants = Transient radiation effect simulation facilitiesPIGNERET, J.Onde électrique. 1995, Vol 75, Num 3, pp 58-63, issn 0030-2430Article

Principe de fonctionnement et technologie des générateurs de haute puissance pulsée = Operation and technology of high pulsed power generatorsEYL, P; ROMARY, P.Onde électrique. 1995, Vol 75, Num 3, pp 64-71, issn 0030-2430Article

A method for fabricating below 22nm feature patterns in quartz moldTERASAKI, Atsunori; SEKI, Junichi; ONO, Haruhito et al.Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 69211N.1-69211N.9, issn 0277-786X, isbn 978-0-8194-7106-2Conference Paper

Assembling of fiber collimators for photonic devicesHONG ZHOU; ZIRONG TANG; MONDAL, Samir K et al.Proceedings - Electronic Components Conference. 2002, pp 821-827, issn 0569-5503, isbn 0-7803-7430-4, 7 p.Conference Paper

Micro Stereo Lithography for 3D MEMS devicesVARADAN, V. K; VARADAN, V. V.SPIE proceedings series. 2001, pp 280-290, isbn 0-8194-4020-5Conference Paper

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PFPE-based materials for the fabrication of micro- and nano-optical componentsGOMEZ, Manuel; LAZZARI, Massimo.Microelectronic engineering. 2012, Vol 97, pp 208-211, issn 0167-9317, 4 p.Article

Silica nanoparticle-embedded sol―gel organic/inorganic hybrid nanocomposite for transparent OLED encapsulationJUNGHO JIN; JAE JUN LEE; BAE, Byeong-Soo et al.Organic electronics (Print). 2012, Vol 13, Num 1, pp 53-57, issn 1566-1199, 5 p.Article

Three-dimensional measurements of UV-imprint process by micro-digital holographic-PTVSATAKE, Shin-Ichi; TANIGUCHI, Jun; KANAI, Takahiro et al.Microelectronic engineering. 2012, Vol 97, pp 51-54, issn 0167-9317, 4 p.Article

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Effect of porogen residue on electrical characteristics of ultra low-k materialsBAKLANOV, Mikhail R; ZHAO, Larry; VAN BESIEN, Els et al.Microelectronic engineering. 2011, Vol 88, Num 6, pp 990-993, issn 0167-9317, 4 p.Article